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2.4.TypicalMethodsforEvaluationofQualityofOxideCrystals
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where:λ-X-raywavelength,d-distancebetweentheplanesatwhichthe
raysarescattered,θ-theangleofraysincidenceonaplane.Thepassage
ofaparallelbeamofX-raysthroughthecrystalresultsintheappearance
ofLaue’sdifractionpattern.Thesymmetryofthedifractionimageob-
tainedbringsinformationonthecrystallographicsystemofagivencrystal
andfullanalysis